Computers

Software and systems to automate analysis of semiconductor defects and testing of wafers. Include databases, SECS/GEM, remote administration of hardware, and e-diagnostics supporting most operating systems. Supports equipment from KLA-Tencor, Applied Materials, ADE, Inspex, Electroglas, TEL, TSK, Teradyne, Credence to name a few.

Offers turn-key automation with vision systems, semi to fully-automatic Diebonder and Diesorter, Inline Blistertape and Reel-2-Reel inspection.