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57129 resources
Using scanning probe microscopy to explore and manipulate semiconductor surfaces. Department of Chemistry at McMaster University.
August 15-18, 2005 conference in Germany for research on force controlled imaging, spectroscopy and manipulation.
Scanning Probe Microscopy: introduction, research work, personnel, recent publications (some .pdf), image gallery, equipment, collaborations and links.
Ultra-high optical resolution with tip enhanced microscopy with a parabolic mirror. Includes Apace and MagicSERS, a program for view/convert Winspec SPE-spectra.